IEEE - Institute of Electrical and Electronics Engineers, Inc. - Suppression of Auger recombination effects in compressively strained quantum-well lasers

Author(s): W.W. Lui ; T. Yamanaka ; Y. Yoshikuni ; K. Yokoyama ; S. Seki
Sponsor(s): IEEE Lasers and Electro-Optics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 1993
Volume: 29
Page Count: 9
Page(s): 1,544 - 1,552
ISSN (Paper): 0018-9197
ISSN (Online): 1558-1713
DOI: 10.1109/3.234389
Regular:

Based on detailed valence band structure, a Monte Carlo analysis of the Auger recombination effects in compressively strained quantum-well diode lasers has been carried out. The recombination... View More

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