IEEE - Institute of Electrical and Electronics Engineers, Inc. - Altitude and latitude variations in avionics SEU and atmospheric neutron flux

Author(s): E. Normand ; T.J. Baker
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1993
Volume: 40
Page Count: 7
Page(s): 1,484 - 1,490
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/23.273514
Regular:

The direct cause of single event upsets (SEUs) in static random-access memories (SRAMs) at aircraft altitudes by atmospheric neutrons has been documented previously. The variation of the in-flight... View More

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