IEEE - Institute of Electrical and Electronics Engineers, Inc. - Phase noise in cryogenic microwave HEMT and MESFET oscillators

Author(s): O. Llopis ; R. Plana ; H. Amine ; L. Escotte ; J. Graffeuil
Sponsor(s): IEEE Microwave Theory and Techniques Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 1993
Volume: 41
Page Count: 6
Page(s): 369 - 374
ISSN (Paper): 0018-9480
ISSN (Online): 1557-9670
DOI: 10.1109/22.223733
Regular:

The influence of cooling on the phase noise of HEMT and MESFET oscillators is addressed. The initial measurements of the device DC characteristics and low-frequency noise (0.1 kHZ-100 kHz) under... View More

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