IEEE - Institute of Electrical and Electronics Engineers, Inc. - Extraction of device noise sources from measured data using circuit simulator software

Author(s): P.K. Ikalainen
Sponsor(s): IEEE Microwave Theory and Techniques Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 1993
Volume: 41
Page Count: 4
Page(s): 340 - 343
ISSN (Paper): 0018-9480
ISSN (Online): 1557-9670
DOI: 10.1109/22.216478
Regular:

A procedure is presented for extracting the properties of device noise sources from experimental data. The extraction procedure can be implemented using commercially available circuit simulators.... View More

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