IEEE - Institute of Electrical and Electronics Engineers, Inc. - Studies of nonlinear bit shift and partial erasure using pseudo-random sequence

Author(s): X. Che ; M.K. Bhattacharyya ; H.N. Bertram
Sponsor(s): IEEE Magnetics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 1993
Volume: 29
Page Count: 3
Page(s): 3,972 - 3,974
ISSN (Paper): 0018-9464
ISSN (Online): 1941-0069
DOI: 10.1109/20.281360
Regular:

A pseudo-random sequence method to identify nonlinear effects has been utilized at high recording densities. This method is extended to distinguish two different nonlinear effects: nonlinear bit... View More

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