IEEE - Institute of Electrical and Electronics Engineers, Inc. - Mutual comparisons of fully automated Josephson-junction arrays voltage-standard systems

Author(s): A. Iwasa ; Y. Sakamoto ; H. Yoshida ; T. Endo
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 1993
Volume: 42
Page Count: 4
Page(s): 368 - 371
ISSN (Paper): 0018-9456
ISSN (Online): 1557-9662
DOI: 10.1109/19.278584
Regular:

In order to test the performances of three sets of fully automated Josephson-junction array voltage-standard systems, mutual comparisons among those systems are carried out. The results obtained... View More

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