IEEE - Institute of Electrical and Electronics Engineers, Inc. - Quality Model Driven Dynamic Analysis

2011 IEEE 35th Annual Computer Software and Applications Conference - COMPSAC 2011

Author(s): Murthy, P.V.R. ; Kumar, V.S. ; Sharma, T. ; Kiron Rao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2011
Conference Location: Munich, Germany, Germany
Conference Date: 18 July 2011
Page(s): 360 - 365
ISBN (Electronic): 978-0-7695-4439-7
ISBN (Paper): 978-1-4577-0544-1
ISBN (Online): 978-0-7695-4439-7
ISSN (Paper): 0730-3157
ISSN (Online): 0730-3157
DOI: 10.1109/COMPSAC.2011.54
Regular:

Release managers often face a dilemma about the quality of software under delivery before a release. The presence of run-time errors such as memory leaks, buffer overflows, and deadlocks affects... View More

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