IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability, reconfiguration, and spare allocation issues in binary-tree architectures based on multiple-level redundancy

Author(s): Y.-Y. Chen ; S.J. Upadhyaya
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Distributed Process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 1993
Volume: 42
Page Count: 11
Page(s): 713 - 723
ISSN (Paper): 0018-9340
DOI: 10.1109/12.277283
Regular:

The locally redundant modular tree (LRMT) schemes offer high yield and reliability for trees of relatively few levels but are less effective for large binary trees due to the imbalance of... View More

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