IEEE - Institute of Electrical and Electronics Engineers, Inc. - A robust smear removal method for inter-frame Charge-Coupled Device star images

2011 Seventh International Conference on Natural Computation (ICNC)

Author(s): Jianwei Gao ; Zhen Zhang ; Rui Yao ; Jinqiu Sun ; Yanning Zhang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2011
Conference Location: Shanghai, China, China
Conference Date: 26 July 2011
Volume: 3
Page(s): 1,805 - 1,808
ISBN (CD): 978-1-4244-9952-6
ISBN (Electronic): 978-1-4244-9953-3
ISBN (Paper): 978-1-4244-9950-2
ISSN (CD): 2157-9555
ISSN (Electronic): 2157-9563
ISSN (Paper): 2157-9555
DOI: 10.1109/ICNC.2011.6022512
Regular:

In order to eliminate the influence of Smear Effect on follow-up processing of star images, this paper researched the source and statistical model of Smear Effect. After researching the working... View More

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