IEEE - Institute of Electrical and Electronics Engineers, Inc. - Closure properties of mixture degradation model

2011 Seventh International Conference on Natural Computation (ICNC)

Author(s): Yao Shuxia ; Zhao Chuancheng ; Zhang Tonghui ; Zhao Xueyan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2011
Conference Location: Shanghai, China, China
Conference Date: 26 July 2011
Volume: 2
Page(s): 936 - 940
ISBN (CD): 978-1-4244-9952-6
ISBN (Electronic): 978-1-4244-9953-3
ISBN (Paper): 978-1-4244-9950-2
ISSN (CD): 2157-9555
ISSN (Electronic): 2157-9563
ISSN (Paper): 2157-9555
DOI: 10.1109/ICNC.2011.6022289
Regular:

Recorded lifetime data, which give the information about the time-to-failure of system units, play a very important role in assessing the system reliability. In this paper, we obtained some... View More

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