IEEE - Institute of Electrical and Electronics Engineers, Inc. - Credit risk assessment based on potential support vector machine

2011 Seventh International Conference on Natural Computation (ICNC)

Author(s): Chen Qing ; Xue Hui-feng ; Yan Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2011
Conference Location: Shanghai, China, China
Conference Date: 26 July 2011
Volume: 1
Page(s): 97 - 101
ISBN (CD): 978-1-4244-9952-6
ISBN (Electronic): 978-1-4244-9953-3
ISBN (Paper): 978-1-4244-9950-2
ISSN (CD): 2157-9555
ISSN (Electronic): 2157-9563
ISSN (Paper): 2157-9555
DOI: 10.1109/ICNC.2011.6022038
Regular:

A potential support vector machine based learning approach is proposed in the paper to solve the problem of classifier establishment and feature selection in credit risk evaluation. Firstly,... View More

Advertisement