IEEE - Institute of Electrical and Electronics Engineers, Inc. - A novel automatic evaluation system for testing radio frequency identification applications

2011 Eighth International Conference on Fuzzy Systems and Knowledge Discovery (FSKD 2011)

Author(s): Tongliang Zhang ; Yongsheng Ding ; Hua Han ; Lei Gao
Sponsor(s): IEEE Circuits Syst. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2011
Conference Location: Shanghai, China
Conference Date: 26 July 2011
Volume: 4
Page(s): 2,456 - 2,460
ISBN (CD): 978-1-61284-179-3
ISBN (Electronic): 978-1-61284-181-6
ISBN (Paper): 978-1-61284-180-9
DOI: 10.1109/FSKD.2011.6020051
Regular:

The number of radio frequency identification (RFID) applications in different fields is increasing rapidly. The test technical for RFID application become important research hot point because of... View More

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