IEEE - Institute of Electrical and Electronics Engineers, Inc. - VLSI testing and test power

2011 International Green Computing Conference (IGCC)

Author(s): Xiaoqing Wen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2011
Conference Location: Orlando, FL, USA, USA
Conference Date: 25 July 2011
Page(s): 1 - 6
ISBN (CD): 978-1-4577-1220-3
ISBN (Electronic): 978-1-4577-1221-0
ISBN (Paper): 978-1-4577-1222-7
DOI: 10.1109/IGCC.2011.6008607
Regular:

This paper first reviews the basics of VLSI testing, focusing on test generation and design for testability. Then it discusses the impact of test power in scan testing, and highlights the need for... View More

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