IEEE - Institute of Electrical and Electronics Engineers, Inc. - Simulation and Verification of UDP Protocol with Fault-Tolerant Mechanism

2011 International Conference on Control, Automation and Systems Engineering (CASE)

Author(s): Wang Min ; Lian Yu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2011
Conference Location: Singapore, Singapore, Singapore
Conference Date: 30 July 2011
Page(s): 1 - 3
ISBN (CD): 978-1-4577-0858-9
ISBN (Electronic): 978-1-4577-0860-2
ISBN (Paper): 978-1-4577-0859-6
DOI: 10.1109/ICCASE.2011.5997617
Regular:

In order to solve large amounts of data transfer problems of industrial control, the paper proposes a fault-tolerant mechanism for UDP (Class UDP). Simulation system was developed in NS II , it... View More

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