IEEE - Institute of Electrical and Electronics Engineers, Inc. - A testing device for reliability of camera IR cut switching

2011 IEEE International Conference on Mechatronics and Automation (ICMA)

Author(s): Teng He ; Zhang Yunzhou ; Wu Chengdong ; Wu Hao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2011
Conference Location: Beijing, China, China
Conference Date: 7 August 2011
Page(s): 1,975 - 1,979
ISBN (CD): 978-1-4244-8114-9
ISBN (Electronic): 978-1-4244-8115-6
ISBN (Paper): 978-1-4244-8113-2
ISSN (CD): 2152-7431
ISSN (Paper): 2152-7431
DOI: 10.1109/ICMA.2011.5986283
Regular:

In this paper, the current problems of CMOS camera and other image sensors in grabbing image are briefly analyzed and the current solutions are introduced. To solve the current issues that... View More

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