IEEE - Institute of Electrical and Electronics Engineers, Inc. - Code acquisition using the locally optimum test statistics in both multiplicative and additive noises

2011 IEEE International Conference on Mechatronics and Automation (ICMA)

Author(s): Shen Feng ; Gai Meng ; Wang Zhao-long ; Li Zhi-qiang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2011
Conference Location: Beijing, China, China
Conference Date: 7 August 2011
Page(s): 1,174 - 1,178
ISBN (CD): 978-1-4244-8114-9
ISBN (Electronic): 978-1-4244-8115-6
ISBN (Paper): 978-1-4244-8113-2
ISSN (CD): 2152-7431
ISSN (Paper): 2152-7431
DOI: 10.1109/ICMA.2011.5985827
Regular:

Multiplicative noise is known to be useful in modeling some environments, which is difficult to describe by additive noise model. In this paper, the pseudo noise (PN) code acquisition in... View More

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