IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dynamic characteristics of tower structure based on finite element analysis

2011 IEEE International Conference on Mechatronics and Automation (ICMA)

Author(s): Tianliang Liu ; Deguang Shang ; Chonggang Ren ; Jingyang Nan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2011
Conference Location: Beijing, China, China
Conference Date: 7 August 2011
Page(s): 1,379 - 1,383
ISBN (CD): 978-1-4244-8114-9
ISBN (Electronic): 978-1-4244-8115-6
ISBN (Paper): 978-1-4244-8113-2
ISSN (CD): 2152-7431
ISSN (Paper): 2152-7431
DOI: 10.1109/ICMA.2011.5985777
Regular:

Natural frequencies of tower structure under two damage conditions were obtained by dynamic testing and finite element analysis. The results showed that finite element model is correct, so seven... View More

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