IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dynamics analysis of the AFM manipulator-sample interaction using nano-contact mechanics models

2011 IEEE International Conference on Mechatronics and Automation (ICMA)

Author(s): Daeinabi, K. ; Korayem, M.H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2011
Conference Location: Beijing, China, China
Conference Date: 7 August 2011
Page(s): 910 - 915
ISBN (CD): 978-1-4244-8114-9
ISBN (Electronic): 978-1-4244-8115-6
ISBN (Paper): 978-1-4244-8113-2
ISSN (CD): 2152-7431
ISSN (Paper): 2152-7431
DOI: 10.1109/ICMA.2011.5985711
Regular:

Various nano-contact mechanics models have been proposed for modeling of the AFM (atomic force microscopy) cantilever tip and its interaction with the sample, adhesion analysis, contact forces,... View More

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