IEEE - Institute of Electrical and Electronics Engineers, Inc. - X-ray diffraction analysis of self-ordered porous anodic alumina

2011 IEEE 4th International Nanoelectronics Conference (INEC)

Author(s): Ya-Fen Wu ; Jeng-Kuang Huang ; Jiunn-Chyi Lee
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2011
Conference Location: Tao-Yuan, Taiwan, Taiwan
Conference Date: 21 June 2011
Page(s): 1 - 2
ISBN (Electronic): 978-1-4577-0378-2
ISBN (Paper): 978-1-4577-0379-9
ISBN (Online): 978-1-4577-0377-5
ISSN (Electronic): 2159-3531
ISSN (Paper): 2159-3523
ISSN (Online): 2159-3523
DOI: 10.1109/INEC.2011.5991726
Regular:

We report on the structural properties of porous anodic alumina (PAA) film produced by the anodization technique under different annealing temperatures. X-ray diffraction (XRD) measurement was... View More

Advertisement