IEEE - Institute of Electrical and Electronics Engineers, Inc. - A semisupervised feature extraction method based on fuzzy-type linear discriminant analysis

2011 IEEE International Conference on Fuzzy Systems (FUZZ-IEEE)

Author(s): Hui-Shan Chu ; Cheng-Hsuan Li ; Bor-Chen Kuo ; Chin-Teng Lin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2011
Conference Location: Taipei, Taiwan, Taiwan
Conference Date: 27 June 2011
Page(s): 1,927 - 1,932
ISBN (Electronic): 978-1-4244-7317-5
ISBN (Paper): 978-1-4244-7315-1
ISBN (Online): 978-1-4244-7316-8
ISSN (Paper): 1098-7584
ISSN (Online): 1098-7584
DOI: 10.1109/FUZZY.2011.6007733
Regular:

Linear discriminant analysis (LDA) is a commonly used feature extraction (FE) method to resolve the Hughes phenomenon for classification. The Hughes phenomenon (also called the curse of... View More

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