IEEE - Institute of Electrical and Electronics Engineers, Inc. - Long term bank failure prediction using Fuzzy Refinement-based Transductive Transfer learning

2011 IEEE International Conference on Fuzzy Systems (FUZZ-IEEE)

Author(s): Behbood, V. ; Jie Lu ; Guangquan Zhang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2011
Conference Location: Taipei, Taiwan, Taiwan
Conference Date: 27 June 2011
Page(s): 2,676 - 2,683
ISBN (Electronic): 978-1-4244-7317-5
ISBN (Paper): 978-1-4244-7315-1
ISBN (Online): 978-1-4244-7316-8
ISSN (Paper): 1098-7584
ISSN (Online): 1098-7584
DOI: 10.1109/FUZZY.2011.6007633
Regular:

Machine learning algorithms, which have been considered as robust methods in different computational fields, assume that the training and test data are drawn from the same distribution. This... View More

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