IEEE - Institute of Electrical and Electronics Engineers, Inc. - A challenge to biometrics by sole pressure while walking

2011 IEEE International Conference on Fuzzy Systems (FUZZ-IEEE)

Author(s): Takeda, T. ; Kuramoto, K. ; Kobashi, S. ; Hata, Y.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2011
Conference Location: Taipei, Taiwan, Taiwan
Conference Date: 27 June 2011
Page(s): 1,430 - 1,435
ISBN (Electronic): 978-1-4244-7317-5
ISBN (Paper): 978-1-4244-7315-1
ISBN (Online): 978-1-4244-7316-8
ISSN (Paper): 1098-7584
ISSN (Online): 1098-7584
DOI: 10.1109/FUZZY.2011.6007541
Regular:

This paper describes a personal verification method based on fuzzy logic using dynamic sole pressure distribution while walking. The method employs a pair id sole pressure distribution change, and... View More

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