IEEE - Institute of Electrical and Electronics Engineers, Inc. - Microindentation of proton exchange layers in lithium niobate crystals

2011 12th International Conference and Seminar of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM 2011)

Author(s): Kichigin, V.I. ; Petukhov, I.V. ; Skachkov, A.P. ; Mushinsky, S.S. ; Shevtsov, D.I. ; Volyntsev, A.B.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2011
Conference Location: Erlagol, Altai, Russia, Russia
Conference Date: 30 June 2011
Page(s): 76 - 79
ISBN (CD): 978-1-61284-794-8
ISBN (Electronic): 978-1-61284-795-5
ISBN (Paper): 978-1-61284-793-1
DOI: 10.1109/EDM.2011.6006899
Regular:

Microindentation of the proton exchange layers on X-cut lithium niobate crystal was performed. It has been found that proton exchange causes an increase in "true" hardness and decrease in crystal... View More

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