IEEE - Institute of Electrical and Electronics Engineers, Inc. - An improved diagnosis technique for IGBTs open-circuit fault in PWM-VSI-fed induction motor drive

2011 IEEE 20th International Symposium on Industrial Electronics (ISIE)

Author(s): Trabelsi, M. ; Boussak, M. ; Mestre, P. ; Gossa, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2011
Conference Location: Gdansk, Poland, Poland
Conference Date: 27 June 2011
Page(s): 2,111 - 2,117
ISBN (Electronic): 978-1-4244-9312-8
ISBN (Paper): 978-1-4244-9310-4
ISBN (Online): 978-1-4244-9311-1
ISSN (Paper): Pending
ISSN (Online): Pending
DOI: 10.1109/ISIE.2011.5984487
Regular:

This paper deals with an improved technique for insulated-gate bipolar transistors (IGBTs) open-circuit fault diagnoses in voltage source inverter (VSI) fed induction motors. The extraction of the... View More

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