IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design technology co-optimization in technology definition for 22nm and beyond

2011 IEEE Symposium on VLSI Technology

Author(s): Northrop, G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2011
Conference Location: Kyoto, Japan, Japan
Conference Date: 14 June 2011
Page(s): 112 - 113
ISBN (CD): 978-4-86348-166-4
ISBN (Paper): 978-1-4244-9949-6
ISSN (CD): 0743-1562
ISSN (Electronic): 2158-9682
ISSN (Paper): 0743-1562
Regular:

The successful scaling of CMOS technology through many generations has carried with it an implicit assumption that the most effective geometries for assembling circuits does not change... View More

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