IEEE - Institute of Electrical and Electronics Engineers, Inc. - Deterministic and stochastic component in RESET transient of HfSiO/FUSI gate RRAM stack

2011 IEEE Symposium on VLSI Technology

Author(s): Degraeve, R. ; Goux, L. ; Roussel, P. ; Wouters, D.J. ; Kittl, J.A. ; Altimime, L. ; Jurczak, M. ; Groeseneken, G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2011
Conference Location: Kyoto, Japan, Japan
Conference Date: 14 June 2011
Page(s): 28 - 29
ISBN (CD): 978-4-86348-166-4
ISBN (Paper): 978-1-4244-9949-6
ISSN (CD): 0743-1562
ISSN (Electronic): 2158-9682
ISSN (Paper): 0743-1562
Regular:

We demonstrate that the minimal achievable IHRS depends on the nature of the filament, quantifiable through the parameter V0 in our QM conduction model. Lowest IHRS is obtained for narrow metallic... View More

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