IEEE - Institute of Electrical and Electronics Engineers, Inc. - Active fault diagnosis for hybrid systems based on sensitivity analysis and EKF

2011 American Control Conference

Author(s): Mehdi Gholami ; Henrik Schioler ; Thomas Bak
Sponsor(s): Control Syst. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2011
Conference Location: San Francisco, CA, USA
Conference Date: 29 June 2011
Page(s): 244 - 249
ISBN (CD): 978-1-4577-0079-8
ISBN (Electronic): 978-1-4577-0081-1
ISBN (Paper): 978-1-4577-0080-4
ISSN (CD): 0743-1619
ISSN (Electronic): 2378-5861
ISSN (Paper): 0743-1619
DOI: 10.1109/ACC.2011.5991038
Regular:

An active fault diagnosis (AFD) approach for different kinds of faults is proposed. The AFD approach excites the system by injecting a so-called excitation input. The input is designed off-line... View More

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