IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new method of determination of the I-V characteristics of negative differential conductance devices

Author(s): R.J. Hwu ; A.M. Abhyankar
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 1992
Volume: 13
Page Count: 3
Page(s): 532 - 534
ISSN (Paper): 0741-3106
ISSN (Online): 1558-0563
DOI: 10.1109/55.192831
Regular:

A method for mapping the complete I-V characteristic of a negative differential conductance (NDC) device has been investigated. This method employs the measurable positive differential conductance... View More

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