IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research on the method of testability modeling based on Bayesian Networks

2011 Second International Conference on Mechanic Automation and Control Engineering (MACE)

Author(s): Guo Yingchun ; Liu Jianmin ; Qiao Xinyong ; Li Huaying ; Shi Yupeng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2011
Conference Location: Inner Mongolia, China, China
Conference Date: 15 July 2011
Page(s): 645 - 648
ISBN (CD): 978-1-4244-9438-5
ISBN (Electronic): 978-1-4244-9439-2
ISBN (Paper): 978-1-4244-9436-1
DOI: 10.1109/MACE.2011.5987007
Regular:

Due to the complexity of the fault mechanism and the testing method, the research on the Design for Testability (DFT) for mechanical system becomes difficult. In this paper, according to... View More

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