IEEE - Institute of Electrical and Electronics Engineers, Inc. - A hybrid evaluation metric for optimizing classifier

2011 3rd Conference on Data Mining and Optimization (DMO)

Author(s): Hossin, M. ; Sulaiman, M.N. ; Mustapha, A. ; Mustapha, N. ; Rahmat, R.W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2011
Conference Location: Putrajaya, Malaysia, Malaysia
Conference Date: 28 June 2011
Page(s): 165 - 170
ISBN (Electronic): 978-1-61284-212-7
ISBN (Paper): 978-1-61284-211-0
ISSN (Electronic): 2155-6946
ISSN (Paper): 2155-6938
DOI: 10.1109/DMO.2011.5976522
Regular:

The accuracy metric has been widely used for discriminating and selecting an optimal solution in constructing an optimized classifier. However, the use of accuracy metric leads the searching... View More

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