IEEE - Institute of Electrical and Electronics Engineers, Inc. - Frequent pattern using Multiple Attribute Value for itemset generation

2011 3rd Conference on Data Mining and Optimization (DMO)

Author(s): Long, Z.A. ; Bakar, A.A. ; Hamdan, A.R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2011
Conference Location: Putrajaya, Malaysia, Malaysia
Conference Date: 28 June 2011
Page(s): 44 - 50
ISBN (Electronic): 978-1-61284-212-7
ISBN (Paper): 978-1-61284-211-0
ISSN (Electronic): 2155-6946
ISSN (Paper): 2155-6938
DOI: 10.1109/DMO.2011.5976503
Regular:

Data mining is the process of finding correlations or patterns among dozens of fields in large relational databases. While Association Rules Mining (ARM) algorithm especially the Apriori algorithm... View More

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