IEEE - Institute of Electrical and Electronics Engineers, Inc. - Error control coding for multi-level cell memories

2011 IEEE 15th International Symposium on Consumer Electronics - (ISCE 2011)

Author(s): Kousa, M.A. ; Sultan, F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2011
Conference Location: Singapore, Singapore, Singapore
Conference Date: 14 June 2011
Page(s): 607 - 610
ISBN (CD): 978-1-61284-841-9
ISBN (Electronic): 978-1-61284-842-6
ISBN (Paper): 978-1-61284-843-3
ISSN (CD): 0747-668X
ISSN (Electronic): 2159-1423
ISSN (Paper): 0747-668X
DOI: 10.1109/ISCE.2011.5973902
Regular:

The ever increasing demand to store huge amounts of data at affordable prices has led to the widespread usage of multi level cell (MLC) memory devices. These memories have the capability to store... View More

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