IEEE - Institute of Electrical and Electronics Engineers, Inc. - The E8 Lattice and Error Correction in Multi-Level Flash Memory

ICC 2011 - 2011 IEEE International Conference on Communications

Author(s): Kurkoski, B.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2011
Conference Location: Kyoto, Japan, Japan
Conference Date: 5 June 2011
Page(s): 1 - 5
ISBN (Electronic): 978-1-61284-233-2
ISBN (Paper): 978-1-61284-232-5
ISBN (Online): 978-1-61284-231-8
ISSN (Paper): 1550-3607
ISSN (Online): 1550-3607
DOI: 10.1109/icc.2011.5963207
Regular:

A construction using the E8 lattice and Reed-Solomon codes for error-correction in flash memory is given. Since E8 lattice decoding errors are bursty, a Reed-Solomon code over GF($2^8$) is well... View More

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