IEEE - Institute of Electrical and Electronics Engineers, Inc. - Testability measures in pseudorandom testing

Author(s): S. Ercolani ; M. Favalli ; M. Damiani ; P. Olivo ; B. Ricco
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 1992
Volume: 11
Page Count: 7
Page(s): 794 - 800
ISSN (Paper): 0278-0070
ISSN (Online): 1937-4151
DOI: 10.1109/43.137524
Regular:

The authors present two methods for computing the fault detection probabilities in combinational networks. The methods provide a deeper insight into the effects of signal correlations caused by... View More

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