IEEE - Institute of Electrical and Electronics Engineers, Inc. - Exploiting Module Locality to Improve Software Fault Prediction

2011 IEEE 9th International Symposium on Parallel and Distributed Processing with Applications Workshops (ISPAW)

Author(s): Cheng-Zen Yang ; Ing-Xiang Chen ; Chin-Sung Fan-Chiang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2011
Conference Location: Busan, Korea (South), Korea (South)
Conference Date: 26 May 2011
Page(s): 342 - 347
ISBN (CD): 978-0-7695-4429-8
ISBN (Paper): 978-1-4577-0524-3
DOI: 10.1109/ISPAW.2011.35
Regular:

Receiving bug reports, developers usually need to spend significant amount of time resolving where to fix the faults. Although previous studies have shown that the revision frequency of a file... View More

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