IEEE - Institute of Electrical and Electronics Engineers, Inc. - OMAP: One-Way Memory Attestation Protocol for Smart Meters

2011 IEEE 9th International Symposium on Parallel and Distributed Processing with Applications Workshops (ISPAW)

Author(s): Kyungsub Song ; Dongwon Seo ; Haemin Park ; Heejo Lee ; Perrig, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2011
Conference Location: Busan, Korea (South), Korea (South)
Conference Date: 26 May 2011
Page(s): 111 - 118
ISBN (CD): 978-0-7695-4429-8
ISBN (Paper): 978-1-4577-0524-3
DOI: 10.1109/ISPAW.2011.37
Regular:

A smart meter is one of the key elements of smart girds. An attacker can compromise smart meters by injecting malicious codes, and take financial benefits by modifying memory contents of the smart... View More

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