IEEE - Institute of Electrical and Electronics Engineers, Inc. - Toward generic and adaptive avionic test systems

2011 NASA/ESA Conference on Adaptive Hardware and Systems (AHS)

Author(s): Afonso, G. ; Ben Atitallah, R. ; Belanger, N. ; Rubio, M. ; Stilkerich, S. ; Dekeyser, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2011
Conference Location: San Diego, CA, USA, USA
Conference Date: 6 June 2011
Page(s): 287 - 294
ISBN (Electronic): 978-1-4577-0599-1
ISBN (Paper): 978-1-4577-0598-4
ISBN (Online): 978-1-4577-0597-7
DOI: 10.1109/AHS.2011.5963949
Regular:

In the manufacturing process, the test phase is considered the most important challenge for designers of safety-critical avionic systems found in modern helicopters. Indeed, these systems often... View More

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