IEEE - Institute of Electrical and Electronics Engineers, Inc. - Performance under Failures of MapReduce Applications

2011 11th IEEE/ACM International Symposium on Cluster, Cloud and Grid Computing (CCGrid)

Author(s): Hui Jin ; Kan Qiao ; Xian-He Sun ; Ying Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2011
Conference Location: Newport Beach, CA, USA, USA
Conference Date: 23 May 2011
Page(s): 608 - 609
ISBN (CD): 978-0-7695-4395-6
ISBN (Paper): 978-1-4577-0129-0
DOI: 10.1109/CCGrid.2011.84
Regular:

The MapReduce programming paradigm is gaining more and more popularity in recent years due to its ability in supporting easy programming, data distribution, as well as fault tolerance. Failure is... View More

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