IEEE - Institute of Electrical and Electronics Engineers, Inc. - Development of a non-deterministic input-output based relationship test data set minimization strategy

2011 IEEE Symposium on Computers & Informatics (ISCI)

Author(s): Ong Hui Yeh ; Zamli, K.Z.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2011
Conference Location: Kuala Lumpur, Malaysia, Malaysia
Conference Date: 20 March 2011
Page(s): 800 - 805
ISBN (CD): 978-1-61284-690-3
ISBN (Electronic): 978-1-61284-691-0
ISBN (Paper): 978-1-61284-689-7
DOI: 10.1109/ISCI.2011.5959020
Regular:

Numerous efficient interaction testing strategies have been proposed in the past literatures to generate optimized test cases for software system under test (SUT). Meanwhile, most of the reported... View More

Advertisement