IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault detection methods: A literature survey

2011 34th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO)

Author(s): Miljkovic, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2011
Conference Location: Opatija, Croatia, Croatia
Conference Date: 23 May 2011
Page(s): 750 - 755
ISBN (CD): 978-953-233-067-0
ISBN (Electronic): 978-953-233-059-5
ISBN (Paper): 978-1-4577-0996-8
Regular:

Fault detection plays an important role in high-cost and safety-critical processes. Early detection of process faults can help avoid abnormal event progression. Fault detection can be accomplished... View More

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