IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automated analysis of leaf venation patterns

2011 Ieee Workshop On Computational Intelligence For Visual Intelligence - Part Of 17273 - 2011 Ssci

Author(s): Mounsef, J. ; Karam, L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2011
Conference Location: Paris, France, France
Conference Date: 11 April 2011
Page(s): 1 - 5
ISBN (CD): 978-1-4244-9971-7
ISBN (Electronic): 978-1-4244-9973-1
ISBN (Paper): 978-1-4244-9972-4
DOI: 10.1109/CIVI.2011.5955019
Regular:

Visual imaging methods have been lately extensively used in applications that are targeted to understand and analyze botanical patterns. There is a rich literature on imaging applications in the... View More

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