IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Random search based effective algorithm for pairwise test data generation

2011 International Conference on Electrical, Control and Computer Engineering (INECCE)

Author(s): Khatun, S. ; Rabbi, K.F. ; Yaakub, C.Y. ; Klaib, M.F.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2011
Conference Location: Kuantan, Malaysia, Malaysia
Conference Date: 21 June 2011
Page(s): 293 - 297
ISBN (CD): 978-1-61284-228-8
ISBN (Electronic): 978-1-61284-230-1
ISBN (Paper): 978-1-61284-229-5
DOI: 10.1109/INECCE.2011.5953894
Regular:

Testing is a very important task to build error free software. As the resources and time to market is limited for a software product, it is impossible to perform exhaustive test i.e., to test all... View More

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