IEEE - Institute of Electrical and Electronics Engineers, Inc. - Resolution and sidelobe structure analysis for RF tomography

2011 IEEE Radar Conference (RadarCon)

Author(s): Parker, J.T. ; Moore, L.J. ; Potter, L.C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2011
Conference Location: Kansas City, MO, USA, USA
Conference Date: 23 May 2011
Page(s): 1,080 - 1,085
ISBN (CD): 978-1-4244-8900-8
ISBN (Electronic): 978-1-4244-8902-2
ISBN (Paper): 978-1-4244-8901-5
ISSN (CD): 1097-5659
ISSN (Paper): 1097-5659
DOI: 10.1109/RADAR.2011.5960701
Regular:

Radio frequency (RF) tomography utilizes a network of spatially diverse sensors to trade geometric diversity for bandwidth, permitting images to be formed with narrowband waveforms. Such a... View More

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