IEEE - Institute of Electrical and Electronics Engineers, Inc. - Investigation of local and global features for face detection

2011 Ieee Symposium On Computational Intelligence For Multimedia, Signal And Vision Processing - Part Of 17273 - 2011 Ssci

Author(s): Pereira, E. ; Gomes, H. ; Moura, E. ; Carvalho, J. ; Tong Zhang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2011
Conference Location: Paris, France, France
Conference Date: 11 April 2011
Page(s): 114 - 121
ISBN (CD): 978-1-4244-9914-4
ISBN (Electronic): 978-1-4244-9915-1
ISBN (Paper): 978-1-4244-9913-7
DOI: 10.1109/CIMSIVP.2011.5949242
Regular:

This work is concerned with the empirical evaluation of a set of local and global features under the context of frontal (including semi-profile) and full profile face classification. Integral LBP,... View More

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