IEEE - Institute of Electrical and Electronics Engineers, Inc. - A statistical response-time analysis of complex real-time embedded systems by using timing traces

2011 6th IEEE International Symposium on Industrial Embedded Systems (SIES)

Author(s): Yue Lu ; Nolte, T. ; Bate, I. ; Cucu-Grosjean, L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2011
Conference Location: Vasteras, Sweden, Sweden
Conference Date: 15 June 2011
Page(s): 43 - 46
ISBN (Electronic): 978-1-61284-820-4
ISBN (Paper): 978-1-61284-818-1
ISBN (Online): 978-1-61284-819-8
DOI: 10.1109/SIES.2011.5953676
Regular:

Real-time embedded systems are becoming ever more complex, and we are reaching the stage where even if static Response-Time Analysis (RTA) was feasible from a cost and technical perspective, the... View More

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