IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dose-rate-independent total dose failure in 54F10 bipolar logic circuits

Author(s): W.C. Jenkins
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1992
Volume: 39
Page Count: 4
Page(s): 1,899 - 1,902
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/23.211384
Regular:

The /sup 60/Co gamma ray total dose performance of unhardened bipolar 54F10 TTL (transistor transistor logic) integrated circuits was measured over dose rates from 0.0088 rad(SiO/sub 2/)/s to 28... View More

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