IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effect of hot-electron injection of high-frequency characteristics of abrupt In/sub 0.52/(Ga/sub 1-x/Al/sub x/)/sub 0.48/As/InGaAs HBT's

Author(s): H. Fukano ; H. Nakajima ; T. Ishibashi ; Y. Takanashi ; M. Fujimoto
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 1992
Volume: 39
Page Count: 7
Page(s): 500 - 506
ISSN (Paper): 0018-9383
ISSN (Online): 1557-9646
DOI: 10.1109/16.123469
Regular:

The effect of hot-electron injection energy (E/sub i/) into the base on the high-frequency characteristics of In/sub 0/52/(Ga/sub 1-x/Al/sub x/)/sub 0.48/As/InGaAs abrupt heterojunction bipolar... View More

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