IEEE - Institute of Electrical and Electronics Engineers, Inc. - The CDF Run II Silicon Detector: Performance and aging studies

2010 IEEE Nuclear Science Symposium and Medical Imaging Conference (2010 NSS/MIC)

Author(s): Corbo, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Knoxville, TN, USA, USA
Conference Date: 30 October 2010
Page(s): 927 - 930
ISBN (CD): 978-1-4244-9104-9
ISBN (Electronic): 978-1-4244-9105-6
ISBN (Paper): 978-1-4244-9106-3
ISSN (CD): 1082-3654
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2010.5873897
Regular:

The Silicon Detector at the CDF Experiment in Run II has been collecting data steadily in a hard radiation environment for the last 9 years. This has led to the presence of some aging effects,... View More

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