IEEE - Institute of Electrical and Electronics Engineers, Inc. - Characterization of segmented HPGe detectors using Pulse Shape Comparison methods

2010 IEEE Nuclear Science Symposium and Medical Imaging Conference (2010 NSS/MIC)

Author(s): Crespi, F.C.L. ; Vandone, V. ; Camera, F. ; Brambilla, S. ; Million, B. ; Riboldi, S. ; Wieland, O. ; Boston, A.J. ; Unsworth, C. ; Boston, H.C. ; Colosimo, S.J. ; Moon, S. ; Nolan, P.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Knoxville, TN, USA, USA
Conference Date: 30 October 2010
Page(s): 825 - 827
ISBN (CD): 978-1-4244-9104-9
ISBN (Electronic): 978-1-4244-9105-6
ISBN (Paper): 978-1-4244-9106-3
ISSN (CD): 1082-3654
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2010.5873875
Regular:

In this work we present the first results of a detector characterization technique named Pulse Shape Comparison Scan (PSCS), applied to a large volume segmented HPGe detector of the AGATA array.... View More

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