IEEE - Institute of Electrical and Electronics Engineers, Inc. - Pulsed proton beam as a diagnostic tool for the characterization of semiconductor detectors at high charge densities

2010 IEEE Nuclear Science Symposium and Medical Imaging Conference (2010 NSS/MIC)

Author(s): Carraresi, L. ; Castoldi, A. ; Grassi, N. ; Guazzoni, C. ; Hartmann, R. ; Mezza, D. ; Taccetti, F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Knoxville, TN, USA, USA
Conference Date: 30 October 2010
Page(s): 737 - 741
ISBN (CD): 978-1-4244-9104-9
ISBN (Electronic): 978-1-4244-9105-6
ISBN (Paper): 978-1-4244-9106-3
ISSN (CD): 1082-3654
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2010.5873856
Regular:

We exploited the possibility of using a pulsed mono-energetic proton beam - coming from the DEFEL beam-line of the Tandetron accelerator at LaBEC (Laboratorio di Tecniche Nucleari per i Beni... View More

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